Kao, FrankFrankKaoVerhulst, AnneAnneVerhulstVandenberghe, WilliamWilliamVandenbergheDe Meyer, KristinKristinDe Meyer2021-10-212021-10-2120130018-9383https://imec-publications.be/handle/20.500.12860/22568Counterdoped pocket thickness optimization of tunnel field-effect transistorsJournal article