Three-tiered risk assessment for engineered nanomaterials. A use case for the semiconductor industry

Prodanov, DimiterDimiterProdanovBelde, P.P.BeldeGeerts, L.L.GeertsL'Allain, C.C.L'AllainLe Feber, M.M.Le FeberMoclair, F.F.MoclairMorelli, A.A.MorelliRoquet, P.P.Roquet2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33829Three-tiered risk assessment for engineered nanomaterials. A use case for the semiconductor industryProceedings paperhttps://iopscience.iop.org/article/10.1088/1742-6596/1323/1/012010/pdf