Krom, RaymondRaymondKromMitard, JeromeJeromeMitardPlourde, ChelseaChelseaPlourdeDe Jaeger, BriceBriceDe JaegerMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13963Characterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETsMeeting abstract