Verleysen, EvelineEvelineVerleysenBender, HugoHugoBenderSchryvers, DominiqueDominiqueSchryversVandervorst, WilfriedWilfriedVandervorst2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/20069Experimental determination of inelastic mean free paths for calculation of TEM specimen thicknessMeeting abstract