Smets, QuentinQuentinSmetsVerreck, DevinDevinVerreckShi, YuanyuanYuanyuanShiArutchelvan, GouthamGouthamArutchelvanGroven, BenjaminBenjaminGrovenWu, XiangyuXiangyuWuSutar, SurajitSurajitSutarBanerjee, SreetamaSreetamaBanerjeeNalin Mehta, AnkitAnkitNalin MehtaLin, DennisDennisLinAsselberghs, IngeIngeAsselberghsRadu, IulianaIulianaRadu2022-01-242021-12-062022-01-2420202380-9248WOS:000717011600002https://imec-publications.be/handle/20.500.12860/38544Sources of variability in scaled MoS2 FETsProceedings paper10.1109/IEDM13553.2020.9371890978-1-7281-8888-1WOS:000717011600002