Eneman, GeertGeertEnemanDe Jaeger, BriceBriceDe JaegerSimoen, EddyEddySimoenBrunco, DavidDavidBruncoHellings, GeertGeertHellingsMitard, JeromeJeromeMitardDe Meyer, KristinKristinDe MeyerMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-172021-10-1720090018-9383https://imec-publications.be/handle/20.500.12860/15275Quantification of drain extension leakage in a scaled bulk germanium pMOS technologyJournal article