ESD protection methodology for deep-submicron CMOS

Bock, KarlheinzKarlheinzBockGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2404ESD protection methodology for deep-submicron CMOSJournal article