Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM

Duan, M.M.DuanZhang, J. F.J. F.ZhangManut, A.A.ManutJi, Z.Z.JiZhang, W.W.ZhangAsenov, A.A.AsenovGerrer, L.L.GerrerReid, D.D.ReidRazaidi, H.H.RazaidiVigar, D.D.VigarChandra, V.V.ChandraAitken, R.R.AitkenKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25231Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAMProceedings paper