Badaroglu, MustafaMustafaBadarogluWambacq, PietPietWambacqVan der Plas, GeertGeertVan der PlasDonnay, StephaneStephaneDonnayGielen, GeorgesGeorgesGielenDe Man, HugoHugoDe Man2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7165Gate-level characterization and reduction of substrate noise in integrated digital circuitsProceedings paper