He, LiangLiangHeChen, H.H.ChenGuo, D.D.D.D.GuoHu, L.N.L.N.HuQin, Y.Y.QinSimoen, EddyEddySimoenClaeys, CorCorClaeysKunert, BernardetteBernardetteKunertWaldron, NiamhNiamhWaldronCollaert, NadineNadineCollaert2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28475Deep traps in In0.3Ga0.7As nFinFETs, studied by generation-recombination noiseProceedings paperhttp://ieeexplore.ieee.org/document/7985987/