Chen, YangyinYangyinChenPourtois, GeoffreyGeoffreyPourtoisAdelmann, ChristophChristophAdelmannGoux, LudovicLudovicGouxGovoreanu, BogdanBogdanGovoreanuDegraeve, RobinRobinDegraeveJurczak, GosiaGosiaJurczakKittl, JorgeJorgeKittlGroeseneken, GuidoGuidoGroesenekenWouters, DirkDirkWouters2021-10-202021-10-2020120003-6951https://imec-publications.be/handle/20.500.12860/20446Insights into Ni-filament formation in unipolar-switching Ni/HfO2/TiN resistive random access memory deviceJournal article