Zhao, ChaoChaoZhaoZhang, J.F.J.F.ZhangGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeve2021-10-152021-10-152002https://imec-publications.be/handle/20.500.12860/7102Generation of hole traps in oxides under high field stressesOral presentation