Stochastic variability of vacancy filament configuration in ultra-thin dielectric RRAM and its impact on OFF-state reliability

Raghavan, NagaNagaRaghavanDegraeve, RobinRobinDegraeveFantini, AndreaAndreaFantiniGoux, LudovicLudovicGouxWouters, DirkDirkWoutersGroeseneken, GuidoGuidoGroesenekenJurczak, GosiaGosiaJurczak2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22972Stochastic variability of vacancy filament configuration in ultra-thin dielectric RRAM and its impact on OFF-state reliabilityProceedings paper