Low-frequency noise asesssment of the silicon passivation of Ge pMOSFETs

Simoen, EddyEddySimoenFirrincieli, AndreaAndreaFirrincieliLeys, FrederikFrederikLeysLoo, RogerRogerLooDe Jaeger, BriceBriceDe JaegerMitard, JeromeJeromeMitardClaeys, CorCorClaeys2021-10-182021-10-1820100040-6090https://imec-publications.be/handle/20.500.12860/17988Low-frequency noise asesssment of the silicon passivation of Ge pMOSFETsJournal article