Impact of partial resistive defects and bias temperature instability on SRAM decoder reliability

Khan, SeyabSeyabKhanTaouil, MottaqiallahMottaqiallahTaouilHamdioui, SaidSaidHamdiouiKukner, HalilHalilKuknerRaghavan, PraveenPraveenRaghavanCatthoor, FranckyFranckyCatthoor2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22598Impact of partial resistive defects and bias temperature instability on SRAM decoder reliabilityProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6727124&searchWithin%3Dkhan%26sortType%3Dasc_p_Sequence%26filter%3DAN