Goes, W.W.GoesToledano Luque, MariaMariaToledano LuqueBaumgartner, O.O.BaumgartnerBina, M.M.BinaSchanovsky, F.F.SchanovskyKaczer, BenBenKaczerGrasser, T.T.Grasser2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22404Understanding correlated drain and gate current fluctuationsProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6599125