Assymetry of the RTSs capture and emission kinetics in nMOSFETs processed in a 0.35μm CMOS technology

Lukyanchikova, N. B.N. B.LukyanchikovaPetrichuk, M. V.M. V.PetrichukGarbar, N. P.N. P.GarbarSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2003Assymetry of the RTSs capture and emission kinetics in nMOSFETs processed in a 0.35μm CMOS technologyProceedings paper