Hussin, RazaidiRazaidiHussinGerrer, LouisLouisGerrerAmoroso, SalvatoreSalvatoreAmorosoWang, LipingLipingWangWeckx, PieterPieterWeckxFranco, JacopoJacopoFrancoVanderheyden, AnneliesAnneliesVanderheydenVanhaeren, DanielleDanielleVanhaerenHoriguchi, NaotoNaotoHoriguchiKaczer, BenBenKaczerAsenov, AsenAsenAsenov2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25405TCAD-based methodology for reliability assessment of nanoscaled MOSFETsProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7251387