ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs

Wu, Wei-MinWei-MinWuChen, Shih-HungShih-HungChenShih, Chun-AnChun-AnShihParvais, BertrandBertrandParvaisCollaert, NadineNadineCollaertKer, Ming-DouMing-DouKerWu, Tian-LiTian-LiWuGroeseneken, GuidoGuidoGroeseneken2024-02-272023-08-262024-02-2720230741-3106WOS:001042045700003https://imec-publications.be/handle/20.500.12860/42401ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTsJournal article10.1109/LED.2023.3290034WOS:001042045700003