Annavarapu, NiravNiravAnnavarapuGoldberg, IakovIakovGoldbergPapadopoulou, AthinaAthinaPapadopoulouElkhouly, KarimKarimElkhoulyGenoe, JanJanGenoeGehlhaar, RobertRobertGehlhaarHeremans, PaulPaulHeremans2023-07-262023-05-252023-06-012023-07-262023-05-052330-4022WOS:000986540000001https://imec-publications.be/handle/20.500.12860/41632Scattered Emission Profile Technique for Accurate and Fast Assessment of Optical Gain in Thin Film Lasing MaterialsJournal article10.1021/acsphotonics.3c00204WOS:000986540000001Materials sciencenet modal gainoptical gain measurementscattered emission profilevariable stripe lengthlasingperovskite