Bronckers, StephaneStephaneBronckersVan der Plas, GeertGeertVan der PlasVandersteen, GerdGerdVandersteenRolain, YvesYvesRolain2021-10-182021-10-1820100018-9456https://imec-publications.be/handle/20.500.12860/16804Substrate noise coupling mechanisms in lightly doped CMOS transistorsJournal article