Toledano Luque, MariaMariaToledano LuqueTang, BaojunBaojunTangDegraeve, RobinRobinDegraeveKaczer, BenBenKaczerSimoen, EddyEddySimoenVan Houdt, JanJanVan HoudtGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120131071-1023https://imec-publications.be/handle/20.500.12860/23178Spectroscopic study of polysilicon traps by means of fast capacitance transientsJournal article