Hellin, DavidDavidHellinFyen, WimWimFyenRip, JensJensRipDelande, TinneTinneDelandeDe Gendt, StefanStefanDe GendtVinckier, ChrisChrisVinckier2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10563Linearity of TXRF: droplet residues versus spin-coated wafersProceedings paper