Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontTakami, Y.Y.TakamiHayama, KiyoteruKiyoteruHayamaSunaga, H.H.SunagaPoortmans, JefJefPoortmansCaymax, MattyMattyCaymaxClauws, P.P.Clauws2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/797Irradiation induced lattice defects in Si1-xGex devices and their effect on device performanceJournal article