Low-Frequency Noise Characterization of High Energy Electron and Gamma-Irradiated Si Junction Diodes

Claeys, C.C.ClaeysDubuc, Jean-PaulJean-PaulDubucSimoen, EddyEddySimoen2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/557Low-Frequency Noise Characterization of High Energy Electron and Gamma-Irradiated Si Junction DiodesOral presentation