Characterization of time-dependent variability using 32k transistor arrays in advanced HK/MG technology

Weckx, PieterPieterWeckxKaczer, BenBenKaczerChen, ChrisChrisChenFranco, JacopoJacopoFrancoBury, ErikErikBuryChanda, KaushikKaushikChandaWatt, J.J.WattRoussel, PhilippePhilippeRousselCatthoor, FranckyFranckyCatthoorGroeseneken, GuidoGuidoGroeseneken2021-10-232021-10-232015https://imec-publications.be/handle/20.500.12860/26168Characterization of time-dependent variability using 32k transistor arrays in advanced HK/MG technologyProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112702