HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale

Jannis, D.D.JannisGuzzinati, G.G.GuzzinatiBeche, A.A.BecheVerbeeck, J.J.VerbeeckPrabhakara, ViveksharmaViveksharmaPrabhakaraBender, HugoHugoBender2021-12-022021-11-022021-12-0220200304-3991WOS:000594768500006https://imec-publications.be/handle/20.500.12860/38334HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscaleJournal article10.1016/j.ultramic.2020.113099WOS:000594768500006BEAM ELECTRON-DIFFRACTIONDRIFTMICROSCOPYDISTORTIONDEVICESSIMEDLINE:32896758