Schuessler, M.M.SchuesslerKrozer, V.V.KrozerBock, KarlheinzKarlheinzBockHartnagel, H. L.H. L.Hartnagel2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1469Pulsed stress reliability investigations of Schottky diodes and HBTsJournal article