Moens, PeterPeterMoensVan den Bosch, GeertGeertVan den BoschDe Keukeleire, CatherineCatherineDe KeukeleireDegraeve, RobinRobinDegraeveTack, MarnixMarnixTackGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152004-10https://imec-publications.be/handle/20.500.12860/9311Hot hole degradation effects in lateral nDMOS transistorsJournal article