Mapping of CMOS FET degradation in bias space - application to DRAM peripheral devices

Kaczer, BenBenKaczerFranco, JacopoJacopoFrancoTyaginov, StanislavStanislavTyaginovO'Sullivan, BarryBarryO'SullivanRitzenthaler, RomainRomainRitzenthalerSchram, TomTomSchramLinten, DimitriDimitriLintenHoriguchi, NaotoNaotoHoriguchiGrasser, TiborTiborGrasser2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26796Mapping of CMOS FET degradation in bias space - application to DRAM peripheral devicesProceedings paperhttp://wodim2016.imm.cnr.it/