Fadida, SivanSivanFadidaNyns, LauraLauraNynsVan Elshocht, SvenSvenVan ElshochtEizenberg, MosheMosheEizenberg2021-10-242021-10-2420170361-5235https://imec-publications.be/handle/20.500.12860/28321Effect of remote oxygen scavenging on electrical properties of Ge-based metal-oxide-semiconductor capacitorsJournal articlehttp://link.springer.com/article/10.1007/s11664-016-4841-6