Bhattacharya, SaraniSaraniBhattacharyaVerbauwhede, IngridIngridVerbauwhede2022-08-252022-07-182022-08-252021naWOS:000805289900117https://imec-publications.be/handle/20.500.12860/40135Exploring Micro-architectural Side-Channel Leakages through Statistical TestingProceedings paper978-3-9819263-5-4WOS:000805289900117