Franco, JacopoJacopoFrancoKaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueRoussel, PhilippePhilippeRousselCho, Moon JuMoon JuChoKauerauf, ThomasThomasKaueraufMitard, JeromeJeromeMitardEneman, GeertGeertEnemanWitters, LiesbethLiesbethWittersGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120130167-9317https://imec-publications.be/handle/20.500.12860/22363Superior reliability of high mobility (Si)Ge channel pMOSFETsJournal article