Charge pumping of single interface traps in submicron MOSFET's

Groeseneken, GuidoGuidoGroesenekenDe Wolf, IngridIngridDe WolfBellens, RudiRudiBellensMaes, HermanHermanMaes2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/181Charge pumping of single interface traps in submicron MOSFET'sProceedings paper