Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns

Kaczer, BenBenKaczerDegraeve, RobinRobinDegraeveAugendre, EmmanuelEmmanuelAugendreJurczak, GosiaGosiaJurczakGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7715Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdownsProceedings paper