Multiscale modeling of the electrostatic impact of self-assembled monolayers used as gate dielectric treatment in organic thin-film transistors

Mityashin, AlexanderAlexanderMityashinRoscioni, Otello MariaOtello MariaRoscioniMuccioli, LucaLucaMuccioliZannoni, ClaudioClaudioZannoniGeskin, VictorVictorGeskinCornil, JérômeJérômeCornilJanssen, DimitriDimitriJanssenSteudel, SoerenSoerenSteudelGenoe, JanJanGenoeHeremans, PaulPaulHeremans2021-10-222021-10-2220141944-8244https://imec-publications.be/handle/20.500.12860/24267Multiscale modeling of the electrostatic impact of self-assembled monolayers used as gate dielectric treatment in organic thin-film transistorsJournal article10.1021/am503873f