Benbakhti, BrahimBrahimBenbakhtiAyubi-Moak, J.S.J.S.Ayubi-MoakKalna, KarolKarolKalnaLin, DennisDennisLinHellings, GeertGeertHellingsBrammertz, GuyGuyBrammertzDe Meyer, KristinKristinDe MeyerThayne, I.I.ThayneAsenov, AsenAsenAsenov2021-10-182021-10-1820100026-2714https://imec-publications.be/handle/20.500.12860/16730Impact of interface state trap density on the performance characteristics of different III-V MOSFET architecturesJournal articlehttp://dx.doi.org/10.1016/j.mee.2009.03.024