Kaczer, BenBenKaczerDegraeve, RobinRobinDegraeveRasras, MahmoudMahmoudRasrasVan de Mieroop, KoenKoenVan de MieroopRoussel, PhilippePhilippeRousselGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6462Impact of MOSFET gate oxide breakdown on digital circuit operation and reliabilityJournal article