A novel hot-hole injection degradation model for lateral nDMOS transistors

Moens, P.P.MoensTack, MarnixMarnixTackDegraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5486A novel hot-hole injection degradation model for lateral nDMOS transistorsProceedings paper