Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films

Hoenicke, PhilippPhilippHoenickeFleischmann, ClaudiaClaudiaFleischmannHermann, PeterPeterHermannBeckhoff, BurkhardBurkhardBeckhoff2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23944Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin filmsMeeting abstract