A compact MOSFET breakdown model for optimization of gate coupled ESD protection circuits

Vassilev, VesselinVesselinVassilevGroeseneken, GuidoGuidoGroesenekenBock, KarlheinzKarlheinzBockMaes, HermanHermanMaes2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3985A compact MOSFET breakdown model for optimization of gate coupled ESD protection circuitsProceedings paper