Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method

DeGroot, D.C.D.C.DeGrootRolain, Y.Y.RolainPintelon, R.R.PintelonSchoukens, J.J.Schoukens2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/8820Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect methodProceedings paper