Chen, YangyinYangyinChenDegraeve, RobinRobinDegraeveGovoreanu, BogdanBogdanGovoreanuClima, SergiuSergiuClimaGoux, LudovicLudovicGouxFantini, AndreaAndreaFantiniKar, Gouri SankarGouri SankarKarWouters, DirkDirkWoutersGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120130741-3106https://imec-publications.be/handle/20.500.12860/22134Postcycling LRS retention analysis in HfO2/HF RRAM 1T1R deviceJournal articlehttp://ieeexplore.ieee.org/document/6490333/