Duflou, RutgerRutgerDuflouHoussa, MichelMichelHoussaAfzalian, AryanAryanAfzalian2024-02-232023-06-192023-06-272024-02-2320231569-8025WOS:001003159400001https://imec-publications.be/handle/20.500.12860/41756Full charge incorporation in ab initio simulations of two-dimensional semiconductor-based devicesJournal article10.1007/s10825-023-02055-3WOS:001003159400001BULK