Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications

Son, YunikYunikSonNoh, Kyung BongKyung BongNohAoulaiche, MarcMarcAoulaicheRitzenthaler, RomainRomainRitzenthalerSchram, TomTomSchramSpessot, AlessioAlessioSpessotFazan, PierrePierreFazanCho, Moon JuMoon JuChoFranco, JacopoJacopoFrancoHoriguchi, NaotoNaotoHoriguchiThean, AaronAaronThean2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24549Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applicationsProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6849377&sortType%3Ddesc_p_Publication_Year%26queryText%3Dritzenth