Todi, V.V.TodiSimoen, EddyEddySimoenEneman, GeertGeertEnemanClaeys, CorCorClaeysSundaram, K.B.K.B.Sundaram2021-10-182021-10-182009https://imec-publications.be/handle/20.500.12860/16312Analysis of then substrate current in Ge pMOSFETsMeeting abstract