Nguyen, Hai P.Hai P.NguyenSu, JialeJialeSuVullers, RuudRuudVullersVereecken, PhilippePhilippeVereeckenFransaer, JanJanFransaer2021-10-192021-10-1920110884-2914https://imec-publications.be/handle/20.500.12860/19479Measurement of Seebeck coefficient of electroplated thermoelectric films in presence of a seed layerJournal article