Makarov, AAMakarovTyaginov, StanislawStanislawTyaginovKaczer, BenBenKaczerJech, M.M.JechVaisman Chasin, AdrianAdrianVaisman ChasinGrill, A.A.GrillHellings, GeertGeertHellingsVexler, M.M.VexlerLinten, DimitriDimitriLintenGrasser, TiborTiborGrasser2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28895Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topologyProceedings paper