Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substrates

Magnani, AlessandroAlessandroMagnaniCosnier, ThibaultThibaultCosnierAmirifar, NooshinNooshinAmirifarChatterjee, UrmimalaUrmimalaChatterjeeZhao, MingMingZhaoLi, XiangdongXiangdongLiGeens, KarenKarenGeensDecoutere, StefaanStefaanDecoutere2022-02-212022-02-2120210026-2714WOS:000635095600008https://imec-publications.be/handle/20.500.12860/38920Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substratesJournal article10.1016/j.microrel.2021.114061WOS:000635095600008