Write/erase cycling endurance of memory cells with SiO2/HfO2 tunnel dielectric

Blomme, PieterPieterBlommeVan Houdt, JanJanVan HoudtDe Meyer, KristinKristinDe Meyer2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/8595Write/erase cycling endurance of memory cells with SiO2/HfO2 tunnel dielectricJournal article